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JEOL JPS-9010
The ideal solution for research institutes and laboratories, universities and experimental productions
JPS-9200
It is used for microanalysis of the surface of a wide range of sample types
JAMP-9500F
It is used to study the production surface
JXA-8530F
Electron probe microanalyzer with Schottky cathode
JXA-8230 Superprobe
Electron probe microanalyzer
JEOL JPS-9010
Photoelectron spectrometer JEOL JPS-9010
XPS Photoelectron Spectrometer (X-ray Photoelectron Spectrometer) for surface microanalysis.
JEOL JPS-9010 is an X-ray photoelectron X-ray spectrometer used for microanalysis of the surface of a wide range of sample types. The new hemispherical electron energy analyzer consists of a combination of electrostatic accelerating lenses and electromagnetic lenses to improve sensitivity by 20 times compared to previous models.
JEOL JPS-9010 is an analytical tool for analyzing and evaluating the elemental composition, chemical state of elements on a surface with high locality.
XPS (X-ray Photoelectron Spectrometer) is a powerful analytical tool for developing new materials, testing the surface of a large number of samples, including metals, semiconductors, high-molecular polymers, etc.
The JEOL JPS-9010 series of instruments consists of three instruments to achieve different research requirements: JPS-9010MC (with a monochromatic X-ray source), JPS-9010MX and JPS-9010TR (using a Total X-ray reflection system- Total Reflection X-ray Photoelectron Spectroscopy (TRXPS)).
XPS Photoelectron Spectrometer (X-ray Photoelectron Spectrometer) for surface microanalysis.
JEOL JPS-9010 is an X-ray photoelectron X-ray spectrometer used for microanalysis of the surface of a wide range of sample types. The new hemispherical electron energy analyzer consists of a combination of electrostatic accelerating lenses and electromagnetic lenses to improve sensitivity by 20 times compared to previous models.
JEOL JPS-9010 is an analytical tool for analyzing and evaluating the elemental composition, chemical state of elements on a surface with high locality.
XPS (X-ray Photoelectron Spectrometer) is a powerful analytical tool for developing new materials, testing the surface of a large number of samples, including metals, semiconductors, high-molecular polymers, etc.
The JEOL JPS-9010 series of instruments consists of three instruments to achieve different research requirements: JPS-9010MC (with a monochromatic X-ray source), JPS-9010MX and JPS-9010TR (using a Total X-ray reflection system- Total Reflection X-ray Photoelectron Spectroscopy (TRXPS)).
- High accuracy
- X-ray source to minimize damage to samples
- Compact X-ray monochromator
- Ultrapure vacuum system
- Automatic analyzer for routine measurements
- A large object table for large samples, such as, for example, a computer hard disk
- Easy-to-use Software
- Software for high-speed peak separation
JPS-9200
JEOL Ltd. is a world leader in the production and development of scanning (scanning) electron microscopes (SEM), transmission electron microscopes (TEM), surface analyzers (AUGER microanalysts, photoelectron spectrometers, electron probe microanalysts EPMA), focused ion beam systems, mass spectrometers, nuclear magnetic resonance (NMR) spectrometers and electron beam lithography systems for the production of semiconductor devices.
Photoelectron spectrometer JEOL JPS-9200
A new development in the field of photoelectron spectroscopy (X-ray Photoelectron Spectrometer) for surface microanalysis.
JEOL JPS-9200 is a new X-ray photoelectron X-ray spectrometer used for microanalysis of the surface of a wide range of sample types. The new hemispherical electron energy analyzer consists of a combination of electrostatic accelerating lenses and electromagnetic lenses to improve sensitivity by 20 times compared to previous models.
As standard, the device is equipped with both monochromatized and non-monochromatized X-ray sources. The minimum diameter of the analytical spot is 30 microns. The possibility of mapping large areas (50 mm x 18 mm) is achieved by mechanically scanning the sample table.
Using the Full Reflection RFEC (TRXPS) mode, the background can be significantly reduced, thus improving the minimum detection limit. The sample table is fully automated and provides smooth and accurate positioning of the analysis point. The JPS-9200 spectrometer is controlled by a personal computer and is easy to operate through a graphical user interface.
Photoelectron spectrometer JEOL JPS-9200
A new development in the field of photoelectron spectroscopy (X-ray Photoelectron Spectrometer) for surface microanalysis.
JEOL JPS-9200 is a new X-ray photoelectron X-ray spectrometer used for microanalysis of the surface of a wide range of sample types. The new hemispherical electron energy analyzer consists of a combination of electrostatic accelerating lenses and electromagnetic lenses to improve sensitivity by 20 times compared to previous models.
As standard, the device is equipped with both monochromatized and non-monochromatized X-ray sources. The minimum diameter of the analytical spot is 30 microns. The possibility of mapping large areas (50 mm x 18 mm) is achieved by mechanically scanning the sample table.
Using the Full Reflection RFEC (TRXPS) mode, the background can be significantly reduced, thus improving the minimum detection limit. The sample table is fully automated and provides smooth and accurate positioning of the analysis point. The JPS-9200 spectrometer is controlled by a personal computer and is easy to operate through a graphical user interface.
JAMP-9500F
Auger microanalyzers with a thermal field electron gun provide information about the chemical composition of samples from a small information volume, which determines their high spatial resolution. The advantage of Auger-electronic microanalysts is the possibility of studying one-dimensional nanoobjects, namely thin (up to one monolayer) films, as well as a very high locality of analysis in the lateral direction. These devices in massive samples provide information on the elemental and chemical composition in areas up to 1 nm deep and about 8 nm in diameter.
The Auger electron spectroscopy method is one of the methods of surface analysis, since the depth of the Auger electron output is very small (about 1 nm), and along with the high surface sensitivity, the Auger microanalyzer allows obtaining information about the distribution of elements and their chemical state both on the surface (two-dimensional distribution or a map of the distribution of elemental composition) and in depth by ion etching of the sample surface. Thus, by layer-by-layer ion etching of the sample surface, it can be realized to obtain three-dimensional information about the distribution of the elemental composition with a resolution of 8 nm on the surface and 1 nm in depth.
The Auger electron spectroscopy method is one of the methods of surface analysis, since the depth of the Auger electron output is very small (about 1 nm), and along with the high surface sensitivity, the Auger microanalyzer allows obtaining information about the distribution of elements and their chemical state both on the surface (two-dimensional distribution or a map of the distribution of elemental composition) and in depth by ion etching of the sample surface. Thus, by layer-by-layer ion etching of the sample surface, it can be realized to obtain three-dimensional information about the distribution of the elemental composition with a resolution of 8 nm on the surface and 1 nm in depth.
JXA-8530F
The JXA-8530F Hyperprobe is the world's first electron probe microanalyzer with a Schottky cathode. The development of the ESMA instrument base is on the way to reduce the area of analysis
(increasing locality) and now, with the help of JXA-8500F, researchers can get results that were not available before.
The vacuum and electron-optical systems were radically improved in the new device. As a result, the probe has become even thinner and the current density is higher, and this has led to increased locality of analysis and signal intensity, even at low accelerating voltages. This also made the analysis more efficient, in less time it is possible to obtain not only a quantitative analysis, but also a map of the distribution of high-quality elements, etc.
Thus, thanks to the radical improvement of the characteristics, the use of the microprobe is expanding, including previously inaccessible ones, such as the analysis of nanoparticles, accurate quantitative analysis of low concentrations of elements, including light ones, the use of the microprobe in solving geochronology problems, etc. In addition to the wave spectrometers, one energy dispersion spectrometer can be installed on the column, which allows qualitative rapid analysis of the entire spectrum (10-20 seconds), as well as quantitative analysis of the main elements (60-150 seconds), mapping by area and along the line.
(increasing locality) and now, with the help of JXA-8500F, researchers can get results that were not available before.
The vacuum and electron-optical systems were radically improved in the new device. As a result, the probe has become even thinner and the current density is higher, and this has led to increased locality of analysis and signal intensity, even at low accelerating voltages. This also made the analysis more efficient, in less time it is possible to obtain not only a quantitative analysis, but also a map of the distribution of high-quality elements, etc.
Thus, thanks to the radical improvement of the characteristics, the use of the microprobe is expanding, including previously inaccessible ones, such as the analysis of nanoparticles, accurate quantitative analysis of low concentrations of elements, including light ones, the use of the microprobe in solving geochronology problems, etc. In addition to the wave spectrometers, one energy dispersion spectrometer can be installed on the column, which allows qualitative rapid analysis of the entire spectrum (10-20 seconds), as well as quantitative analysis of the main elements (60-150 seconds), mapping by area and along the line.
JXA-8230 Superprobe
The newest model of the electron probe microanalyzer (microprobe) JEOL JXA-8230, the fifth generation of the Superprob, is a logical continuation of the line of devices of this class JEOL JXA-8100 and JXA-8200 and has, in comparison with them, a number of innovations and advantages.
JEOL developers work closely with researchers, taking into account their recommendations and wishes. As a result of such cooperation, a device was created that combines the best characteristics, the widest possibilities and ease of operation. The microprobe is intended primarily for the local quantitative analysis of a large number of samples in the range of elements from beryllium to uranium, the construction of maps of the distribution of elements by area, along the profile, etc. The detection limit for most elements is no worse than 10ppm, depending on the applicable standards, sample preparation method and measurement techniques.
An electron-optical system with a powerful stabilization system, from 1 to 5 wave spectrometers plus one energy dispersion, a large selection of software, a high–precision goniometric table with a motorized drive - all this allows the operator to only outline points for analysis during the day.
The microprobe will analyze everything automatically. Unlike the devices of previous generations, the new models allow obtaining not only analyses, but also high-quality images in secondary and reflected electrons, cathodoluminescence patterns and diffraction patterns of reflected electrons.
JEOL developers work closely with researchers, taking into account their recommendations and wishes. As a result of such cooperation, a device was created that combines the best characteristics, the widest possibilities and ease of operation. The microprobe is intended primarily for the local quantitative analysis of a large number of samples in the range of elements from beryllium to uranium, the construction of maps of the distribution of elements by area, along the profile, etc. The detection limit for most elements is no worse than 10ppm, depending on the applicable standards, sample preparation method and measurement techniques.
An electron-optical system with a powerful stabilization system, from 1 to 5 wave spectrometers plus one energy dispersion, a large selection of software, a high–precision goniometric table with a motorized drive - all this allows the operator to only outline points for analysis during the day.
The microprobe will analyze everything automatically. Unlike the devices of previous generations, the new models allow obtaining not only analyses, but also high-quality images in secondary and reflected electrons, cathodoluminescence patterns and diffraction patterns of reflected electrons.
SMZ25
Application: Medical devices, MEMS, Antennas, Metallurgical industry, Telecommunications and Electronics, etc.
SMZ18
A microscope with a parallel optical system allows you to obtain both macro and micro images
SMZ1270
Application: Medical devices, MEMS, Antennas, Optoelectronics, Metallurgical industry, Telecommunications and Electronics
SMZ1270i
It has best-in-class functionality and zoom ratio, improved optics and intelligent image acquisition function
SMZ1000
Stereomicroscope with parallel optical system and 10:1 zoom ratio, excellent optics quality and advanced ergonomics
SMZ800
Stereomicroscope with parallel optical system
SMZ800N
The microscope is characterized by ease of use and high resolution
SMZ745
To implement 7.5x scaling, the Grenou optical system is used
SMZ445
They provide the highest optical quality characteristic of the most advanced series of Nikon stereoscopic microscopes
SMZ460
Compact, lightweight and economical microscopes with new optics equipped with Porro prism and Grenou optical system
SMZ25
The MZ 25 and SMZ 18 have revolutionized the field of stereomicroscopy, thanks to the unique range of transfocation, modular design, ease of operation and super-productive optics. The new SMZ series models have a wide range of functions, ranging from obtaining basic stereoscopic images of unsurpassed quality to performing the most advanced observations.
The innovative optical system “Perfect Zoom Optics” for the first time in history provides a transfocation coefficient of 25:1. Even when using a 1x lens, the SMZ25 model registers the entire 35 mm Petri dish and simultaneously shows microscopic details.
Specifications
The innovative optical system “Perfect Zoom Optics” for the first time in history provides a transfocation coefficient of 25:1. Even when using a 1x lens, the SMZ25 model registers the entire 35 mm Petri dish and simultaneously shows microscopic details.
Specifications
- The world's largest zoom range (25:1) and the highest resolution among the SMZ series models (SMZ 25)
- Motorized focusing and magnification systems in the SM 25 model
- Crystal clear images when observed using the fluorescence method, as with conventional lighting methods
- Easy-to-operate base unit in a flat housing, with oblique coherent contrast illumination (OCC) (oblique illumination method developed by Nikon)
SMZ18
A research microscope with a parallel optical system allows you to obtain both macro and micro images in one hand tool for convenient inexpensive imaging and manipulation of both individual cells and whole organisms Highly efficient faceted lenses allow you to obtain crystal clear fluorescent images with uniform brightness throughout the field of view.
Using improved epi-fluorescence technology to improve the signal-to-noise ratio and brightness and to obtain high-contrast images even in the low magnification range, the instrument has an excellent ability to detect induced luminescence (fluorescence) compared to the capabilities of a traditional fluorescence microscope.
Using improved epi-fluorescence technology to improve the signal-to-noise ratio and brightness and to obtain high-contrast images even in the low magnification range, the instrument has an excellent ability to detect induced luminescence (fluorescence) compared to the capabilities of a traditional fluorescence microscope.
SMZ1270
Universal stereo microscopes of the Nikon SMZ1270 series have excellent optical characteristics, such as high magnification, high zoom ratio and high resolution, as well as wide operational qualities. The possibility of using parallel optics makes these models suitable for a wide range of jobs.
There are two models to choose from:
SMZ1270 - without automatic magnification detection.
SMZ1270i - with automatic magnification detection.
There are two models to choose from:
SMZ1270 - without automatic magnification detection.
SMZ1270i - with automatic magnification detection.
SMZ1270i
The new stereo microscope with parallel optical system has best-in-class functionality and zoom ratio, improved optics and intelligent image acquisition function.
The instrument has a trinocular inclined tube and a revolving lens mechanism.
The instrument has a trinocular inclined tube and a revolving lens mechanism.
- Optical system: parallel optics
- Transfocation ratio: -2.7:1
- Magnification range: -0.63 – 8x (in increments 0.63/1/2/3/4/6/ 8x )
- Total magnification: -3.15 – 480x (depending on the lens and eyepiece used) (with coaxial episcopic illuminator: 15 – 540x)
- Tubes: Tilt angle 20° (P-B Binocular tube) / 15° (P-TL100
- Trinocular tube) / 0°-30° (P-TERG100
- Trinocular Inclined tube, P-TERG50 Trinocular Inclined tube)
- Eyepieces: C-W10xB (F.N. 22), C-W15x (F.N. 16), C-W20x (F.N. 12.5), C-W30x (F.N. 7)
- Lenses: Plan Apo 0.5x/WF, Plan Apo 0.75x/WF, Plan Apo 1x/WF, ED Plan 1.5x/WF, ED Plan 2x/WF
- Working Distance: 70mm (with Plan Apo 1x/WF)
SMZ1000
A stereo microscope with a parallel optical system and a 10:1 zoom ratio, excellent optics quality and advanced ergonomics.
This is one of Nikon's advanced stereo microscopes, combining excellent optical performance and ergonomics. Thanks to the lenses with a high numerical aperture and the unique Nikon lighting system, the SMZ1000 stereomicroscope can solve the most complex image creation and processing tasks that previously were only possible for complex modular microscopes.
This is one of Nikon's advanced stereo microscopes, combining excellent optical performance and ergonomics. Thanks to the lenses with a high numerical aperture and the unique Nikon lighting system, the SMZ1000 stereomicroscope can solve the most complex image creation and processing tasks that previously were only possible for complex modular microscopes.
SMZ800
A stereomicroscope with a parallel optical system is a combination of an ergonomic design, a 6.3:1 zoom ratio and ample opportunities for expansion in functionality.
Thanks to the ergonomic design of the microscope, the operator can take a comfortable position while working, while fatigue does not accumulate during long hours of observation. In addition to the excellent optical characteristics, this microscope offers a wide range of accessories that allow you to expand the system according to your needs at an affordable price.
Thanks to the ergonomic design of the microscope, the operator can take a comfortable position while working, while fatigue does not accumulate during long hours of observation. In addition to the excellent optical characteristics, this microscope offers a wide range of accessories that allow you to expand the system according to your needs at an affordable price.
SMZ800N
Due to the increased magnification range up to 8x (1x - 8x), this latest Nikon stereo microscope is characterized by ease of use and high resolution, which is important, for example, when used in the field of ECO. In addition, the newly developed Plan Apo WF and ED plan WF lenses allow you to get clearer and clearer images.
- Zoom range: 1-8x
- Magnification: 5 – 480x (depending on eyepiece and lenses)
- With coaxial episcopical illuminator: 22.5 - 540x
SMZ745
To implement 7.5x scaling, the Grenou optical system is used. The magnification range from 0.67x to 5x provides a wide range of observations.
In addition to the high zoom and magnification multiplicity, the Nikon SMZ745T stereo microscope has a large working distance of 115 mm.
The Nikon stereoscopic microscope is available in two versions: the SMZ745T model with a built-in trinocular head (with a port for a digital camera) and the SMZ745 model with a binocular.
The SMZ745T model is equipped with an optical path switching lever, which makes it easy to switch between the eyepiece and the camera. Camera port and built-in 0.55x C-mount adapter, allows you to connect digital cameras of the DS series from Nikon.
In addition to the high zoom and magnification multiplicity, the Nikon SMZ745T stereo microscope has a large working distance of 115 mm.
The Nikon stereoscopic microscope is available in two versions: the SMZ745T model with a built-in trinocular head (with a port for a digital camera) and the SMZ745 model with a binocular.
The SMZ745T model is equipped with an optical path switching lever, which makes it easy to switch between the eyepiece and the camera. Camera port and built-in 0.55x C-mount adapter, allows you to connect digital cameras of the DS series from Nikon.
SMZ445
The SMZ445 and SMZ460 microscopes provide the highest optical quality characteristic of the most advanced series of Nikon stereoscopic microscopes. Porro prisms provide lightness and compactness of the design.
There are two models to choose from:
SMZ445 with a magnification of 0.8x – 3.5x and a tilt angle of 45°,
SMZ460 with a magnification of 0.7 x – 3.0x and a tilt angle of 60°.
Thanks to the new LED diascopic/episcopical tripod, these microscopes enable the observation of a wide range of samples, including Petri dishes, plants, insects, small animals and minerals.
There are two models to choose from:
SMZ445 with a magnification of 0.8x – 3.5x and a tilt angle of 45°,
SMZ460 with a magnification of 0.7 x – 3.0x and a tilt angle of 60°.
Thanks to the new LED diascopic/episcopical tripod, these microscopes enable the observation of a wide range of samples, including Petri dishes, plants, insects, small animals and minerals.
SMZ460
Compact, lightweight and economical microscopes with new optics equipped with a Porro prism and a Grenou optical system.
Microscopes models differ in the angle of the eyepieces and zoom zoom:
SMZ445 with a magnification of 0.8 x – 3.5 x and a tilt angle of 45°
SMZ460 with 0.7x – 3.0x magnification and 60° tilt angle
Microscopes models differ in the angle of the eyepieces and zoom zoom:
SMZ445 with a magnification of 0.8 x – 3.5 x and a tilt angle of 45°
SMZ460 with 0.7x – 3.0x magnification and 60° tilt angle
AZ100 Multizoom
A system for obtaining macro images for use in the field of biomedicine and industry
DS-Qi2 Monochrome cooled camera
Allows you to get images with an ultra-high resolution of 4908 x 3264 pixels (16.25 Megapixels)
DS-Ri2 Color Camera
Allows you to get images with an ultra-high resolution of 4908 x 3264 pixels (16.25 Megapixels)
DS-Vi1 high-speed data transfer camera
Allows you to get images with a resolution of 1600 x 1200 pixels
DS-Fi1c Color Cooled Camera
Allows you to get images with a high resolution of 2560 x 1920 pixels
AZ100 Multizoom
- A system for obtaining macro images for use in the field of biomedicine and industry.
- Passing light: light field, DICK Nomarski, simple polarization and oblique illumination
- Reflected light: fluorescence, DICK Nomarski, coaxial lighting and LED "cold" lighting
- Magnification range: From 5x to 400x (depending on the combination of eyepiece and lens), from 6.25x to 500x when using a coaxial illuminator
DS-Qi2 Monochrome cooled camera
Allows you to get images with an ultra-high resolution of 4908 x 3264 pixels (16.25 Megapixels).
Thanks to the optimization of CMOS (CMOS) sensors of digital SLR cameras and microscopy imaging technology, Nikon has developed a high-resolution monochrome camera DS-Qi2 in Nikon FX format.
The large pixel size of 7.3 microns, high quantum efficiency and low reading noise allow DS-Qi2 to register even weak fluorescent signals.
The linearity error is less than 1%, which allows accurate measurements of signal intensity.
The reading noise of 2.2 electrons, a large capacitance and a dark noise of 0.6 electrons make it possible to register signals with a very low noise level.
Connection to the computer is carried out directly via USB3.0 cable
Serial shooting of fluorescent images is available in the NIS-Elements program. The camera provides a large field of view along with the registration of ultra-small structures.
Thanks to the optimization of CMOS (CMOS) sensors of digital SLR cameras and microscopy imaging technology, Nikon has developed a high-resolution monochrome camera DS-Qi2 in Nikon FX format.
The large pixel size of 7.3 microns, high quantum efficiency and low reading noise allow DS-Qi2 to register even weak fluorescent signals.
The linearity error is less than 1%, which allows accurate measurements of signal intensity.
The reading noise of 2.2 electrons, a large capacitance and a dark noise of 0.6 electrons make it possible to register signals with a very low noise level.
Connection to the computer is carried out directly via USB3.0 cable
Serial shooting of fluorescent images is available in the NIS-Elements program. The camera provides a large field of view along with the registration of ultra-small structures.
DS-Ri2 Color Camera
Allows you to get images with an ultra-high resolution of 4908 x 3264 pixels (16.25 Megapixels).
Thanks to the optimization of CMOS (CMOS) sensors of digital SLR cameras and microscopy imaging technology, Nikon has developed a high-resolution DS-Ri2 color camera in Nikon FX format.
Nikon DS-Ri2 has excellent color reproduction and fast speed.
To work with the DS-Ri2 camera, no additional control units are required, connection to the computer is carried out via a USB3.0 cable.
Viewing and analysis of images are available in the NIS-Elements program.
Thanks to the optimization of CMOS (CMOS) sensors of digital SLR cameras and microscopy imaging technology, Nikon has developed a high-resolution DS-Ri2 color camera in Nikon FX format.
Nikon DS-Ri2 has excellent color reproduction and fast speed.
To work with the DS-Ri2 camera, no additional control units are required, connection to the computer is carried out via a USB3.0 cable.
Viewing and analysis of images are available in the NIS-Elements program.
DS-Vi1 high-speed data transfer camera
Allows you to get images with an ultra-high resolution of 4908 x 3264 pixels (16.25 Megapixels).
Thanks to the optimization of CMOS (CMOS) sensors of digital SLR cameras and microscopy imaging technology, Nikon has developed a high-resolution DS-Ri2 color camera in Nikon FX format.
Nikon DS-Ri2 has excellent color reproduction and fast speed.
To work with the DS-Ri2 camera, no additional control units are required, connection to the computer is carried out via a USB3.0 cable.
Viewing and analysis of images are available in the NIS-Elements program.
Thanks to the optimization of CMOS (CMOS) sensors of digital SLR cameras and microscopy imaging technology, Nikon has developed a high-resolution DS-Ri2 color camera in Nikon FX format.
Nikon DS-Ri2 has excellent color reproduction and fast speed.
To work with the DS-Ri2 camera, no additional control units are required, connection to the computer is carried out via a USB3.0 cable.
Viewing and analysis of images are available in the NIS-Elements program.
DS-Fi1c Color Cooled Camera
Allows you to get images with a high resolution of 2560 x 1920 pixels.
The camera has a 5.0-megapixel color CCD matrix and a Peltier element that cools the camera 20°C below ambient temperature. Even when obtaining fluorescent images that require a longer exposure time, it is possible to obtain high-contrast images with a low level of thermal noise.
To work with the camera, the DS-L3/U3 control unit is required
The camera has a 5.0-megapixel color CCD matrix and a Peltier element that cools the camera 20°C below ambient temperature. Even when obtaining fluorescent images that require a longer exposure time, it is possible to obtain high-contrast images with a low level of thermal noise.
To work with the camera, the DS-L3/U3 control unit is required
DS-Fi2 Color Camera
Allows you to get images with a high resolution of 2560 x 1920 pixels
DS-U3 control unit
Allows you to control all functions via a computer and is easily configured to perform various tasks
DS-L3 autonomous control unit
Provides fast image acquisition even without a computer or computer monitor
NIKON NEXIV FOUP (NEXIV VMR-C4540)
Fully automated system for measuring cassettes for semiconductor wafers
NEXIV Confocal VMZ-K6555
Advanced confocal metrological vision system provides new capabilities according to the requirements
DS-Fi2 Color Camera
Allows you to get images with a high resolution of 2560 x 1920 pixels. It can be used to perform various tasks, including observations using the light field method, phase contrast and differential interference contrast.
In addition to the high speed of 21 frames/sec, this model provides for adjusting the exposure time to adapt to different samples.
To work with the camera, the DS-L3/U3 control unit is required
CCD matrix: 2/3 inch high-density CCD matrix; Total number of pixels: 5.24 megapixels (the number of effective megapixels is 5.07)
In addition to the high speed of 21 frames/sec, this model provides for adjusting the exposure time to adapt to different samples.
To work with the camera, the DS-L3/U3 control unit is required
CCD matrix: 2/3 inch high-density CCD matrix; Total number of pixels: 5.24 megapixels (the number of effective megapixels is 5.07)
DS-U3 control unit
It allows you to control all functions via a computer and is easily configured to perform various tasks, ranging from displaying and shooting "live" images to modern image processing and analysis.
Provides control of motorized microscope units (rotation of the revolver or filter turret, etc.) and automatic determination of the magnification coefficient of the lenses (when determining the condition of the revolver).
The connection to the computer is via the IEEE1394b 9-9pin cable.
The location of the screen depends on the tasks being performed. Using the buttons and tabs, you can change the position of each window or turn the screen on/off.
Provides control of motorized microscope units (rotation of the revolver or filter turret, etc.) and automatic determination of the magnification coefficient of the lenses (when determining the condition of the revolver).
The connection to the computer is via the IEEE1394b 9-9pin cable.
The location of the screen depends on the tasks being performed. Using the buttons and tabs, you can change the position of each window or turn the screen on/off.
DS-L3 autonomous control unit
Provides fast image acquisition even without a computer or computer monitor.
Built-in 8.4" touch screen with 1024 x 768 resolution. Easy to use, it provides easy setup and operation of the camera
Optimal shooting parameters for each type of sample and observation method can be easily adjusted using icons.
Easy and intuitive menu.
There are five shooting modes that provide images of biological samples, four recording modes for materials science and up to seven user modes with freely configurable shooting parameters.
Built-in 8.4" touch screen with 1024 x 768 resolution. Easy to use, it provides easy setup and operation of the camera
Optimal shooting parameters for each type of sample and observation method can be easily adjusted using icons.
Easy and intuitive menu.
There are five shooting modes that provide images of biological samples, four recording modes for materials science and up to seven user modes with freely configurable shooting parameters.
NIKON NEXIV FOUP (NEXIV VMR-C4540)
NEXIV FOUP (NEXIV VMR-C4540) contactless, fully automated system for measuring cassettes for semiconductor wafers
Provides measurement of all sizes necessary for the production of cassettes for semiconductor wafers, including monitoring of deformation caused by the aging of cassettes.
The NEXIV FOUP system (NEXIV VMR-C4540), designed for 300 mm FOUP and FOSB cassettes, detects hard-to-distinguish edges through the use of various lighting characteristics and unique image processing technologies from Nikon. By implementing the Laser AF system, which provides the possibility of fast, non-contact focusing, even in the case of transparent surfaces and along the periphery of the plate, including the very edges, the VMR-C4540 system can measure the dimensions of the SEMI standard with very high accuracy.
Provides measurement of all sizes necessary for the production of cassettes for semiconductor wafers, including monitoring of deformation caused by the aging of cassettes.
The NEXIV FOUP system (NEXIV VMR-C4540), designed for 300 mm FOUP and FOSB cassettes, detects hard-to-distinguish edges through the use of various lighting characteristics and unique image processing technologies from Nikon. By implementing the Laser AF system, which provides the possibility of fast, non-contact focusing, even in the case of transparent surfaces and along the periphery of the plate, including the very edges, the VMR-C4540 system can measure the dimensions of the SEMI standard with very high accuracy.
NEXIV Confocal VMZ-K6555
Advanced confocal metrological vision system provides new capabilities according to customer requirements.
The new NEXIV VMZ-K6555 confocal vision system was developed as a continuation of NIKON's leadership in the field of opto-mechatronics technologies.
The system combines various confocal optics for fast accurate determination of the dimensions of a three-dimensional surface, image acquisition technology and TTL laser autofocus system. This allows you to measure both the 2D dimensions and the height of the structure on various surfaces, i.e. to obtain a 3-D picture of the surface.
The new NEXIV VMZ-K6555 confocal vision system was developed as a continuation of NIKON's leadership in the field of opto-mechatronics technologies.
The system combines various confocal optics for fast accurate determination of the dimensions of a three-dimensional surface, image acquisition technology and TTL laser autofocus system. This allows you to measure both the 2D dimensions and the height of the structure on various surfaces, i.e. to obtain a 3-D picture of the surface.
JEM-F200
Universal 200kV analytical transmission electron microscope of the new generation
JEM-2800
High-performance analytical PEM with automated control
JEM-ARM300F
An electron microscope with atomic resolution and a maximum accelerating voltage of 300 kV, equipped with a Cs corrector
JEM-1000
It has a high (1 megavolt) accelerating voltage, the wavelength (λ) of electrons is short
JEOL JEM-1011
The electronic optics of the device is designed to obtain maximum contrast on biological preparations
JEOL JEM-1400
The latest device optimized for obtaining high-contrast high-resolution images, primarily on biomedical samples
JEOL JEM-2100
It has an improved control system and better vibration protection.
JEOL JEM-2100F
High stability, excellent technical characteristics, extensibility of functionality, high resolution are the main features of this device
JEOL JEM-2200FS
The optimal solution for research in the field of nanotechnology, including nanobiotechnology, materials science and the semiconductor industry
JEOL JEM-ARM200F
The highest guaranteed resolution in the world in the transmission raster mode with a dark-field detector (STEM-HAADF) is 0.08 nm
JEOL JEM-3100F
A transmission electron microscope with field emission having a resolution of 0.17 nm is the best indicator among all similar devices available on the market
JEM-3200FS
The world's only 300 kV transmission electron microscope with an energy Omega filter built into the column
JEM-F200
This is a universal 200kV analytical transmission electron microscope of a new generation, embodying the entire long-term experience of JEOL specialists in the development of user-friendly, reliable high-resolution TEMS.
This electronic allows you to implement a wide range of methods for obtaining images from light-field / dark-field TEM or PREM, while it is possible to use various electron sources (thermal field or auto-emission), different pole tips and various prefixes to study any samples and solve any problems.
This electronic allows you to implement a wide range of methods for obtaining images from light-field / dark-field TEM or PREM, while it is possible to use various electron sources (thermal field or auto-emission), different pole tips and various prefixes to study any samples and solve any problems.
JEM-2800
This is a high-performance analytical PEM with automated control
Universal TEM receives micrographs in transmission, scanning transmission and scanning microscopes, performs highly sensitive elemental analysis using a wide-angle energy dispersion spectrometer (EMF) and chemical analysis using a spectrometer of characteristic electron energy losses, allows to estimate the size of components, to conduct tomography and "in situ" observations of samples. The JEM-2800 fully meets the requirements for working in clean rooms.
Universal TEM receives micrographs in transmission, scanning transmission and scanning microscopes, performs highly sensitive elemental analysis using a wide-angle energy dispersion spectrometer (EMF) and chemical analysis using a spectrometer of characteristic electron energy losses, allows to estimate the size of components, to conduct tomography and "in situ" observations of samples. The JEM-2800 fully meets the requirements for working in clean rooms.
JEM-ARM300F
An electron microscope with atomic resolution and a maximum accelerating voltage of 300 kV, equipped with a Cs corrector (dodecapole corrector of spherical aberrations). The tool guarantees an unprecedented STEM-HAADF (with a ring dark-field high-angle detector) resolution of 63 pm
JEOL's patented PREM (STEM) Cs Corrector (Spherical Aberration corrector) provides a guaranteed resolution of 63 pm for transmission scanning Electron microscopy (STEM) images
JEOL's patented PREM (STEM) Cs Corrector (Spherical Aberration corrector) provides a guaranteed resolution of 63 pm for transmission scanning Electron microscopy (STEM) images
JEM-1000
Due to the fact that an ultra–high-voltage electron microscope has a high (1 megavolt) accelerating voltage, the wavelength (λ) of electrons is short - and this is the main parameter determining the resolution of the microscope (d) in accordance with the formula
d = 0.65Cs0.25λ0.75
In which Cs is the coefficient of spherical aberration. Thus, with an ultra-high-voltage electron microscope, atomic resolution is obtained regardless of the size of the gap of the pole tip of the objective lens.
Another advantage of the ultra-high-voltage electron microscope is the high penetrating power, which allows obtaining clearly distinguishable images by revealing the structures of thick-layer samples. This is the biggest advantage of an ultra-high-voltage microscope. Usually, the sample for a (transmission) electron microscope should be ultra-thin. Ultra-thin samples sometimes lose the basic properties of the material that is used as a sample. With the advantage of ultra-high voltage , it is possible to explore
d = 0.65Cs0.25λ0.75
In which Cs is the coefficient of spherical aberration. Thus, with an ultra-high-voltage electron microscope, atomic resolution is obtained regardless of the size of the gap of the pole tip of the objective lens.
Another advantage of the ultra-high-voltage electron microscope is the high penetrating power, which allows obtaining clearly distinguishable images by revealing the structures of thick-layer samples. This is the biggest advantage of an ultra-high-voltage microscope. Usually, the sample for a (transmission) electron microscope should be ultra-thin. Ultra-thin samples sometimes lose the basic properties of the material that is used as a sample. With the advantage of ultra-high voltage , it is possible to explore
JEOL JEM-1011
JEM-1011 is the successor of the best traditions of the "best seller" of all time, the famous JEM-100. The electronic optics of the device is designed to obtain maximum contrast on biological preparations. The electronic optics and vacuum system are controlled by a computer, and the image can be recorded on a wide-angle digital camera.
The control of the device is based on the principle of "one button", that is, many standard sequences of actions are performed with one command, for example: switching on and off the device, high voltage, cathode glow, sample change, etc.
The JEM–1011 electron microscope, a compact, exceptionally easy-to-operate transmission electron microscope, was developed based on the latest advances in electronic optics for the work of researchers in the field of medicine and biology.
The control of the device is based on the principle of "one button", that is, many standard sequences of actions are performed with one command, for example: switching on and off the device, high voltage, cathode glow, sample change, etc.
The JEM–1011 electron microscope, a compact, exceptionally easy-to-operate transmission electron microscope, was developed based on the latest advances in electronic optics for the work of researchers in the field of medicine and biology.
JEOL JEM-1400
JEM-1400 is the latest device optimized for obtaining high—contrast, high-resolution images, primarily on biomedical samples.
The device can be equipped with digital image registration systems, both manufactured by JEOL (with Hamamatsu matrices) and manufactured by third companies.
Much attention was paid to the simplicity of management and a high degree of automation when performing all operations during the development of this TEM. Therefore, the operator can fully concentrate on the object of research, without being distracted by performing any routine actions.
The newest transmission electron microscope JEM-1400 with high performance and high-contrast electronic optics, having a maximum accelerating voltage of 120 kV and excellent functions for obtaining digitized images and expandable to an analytical configuration, is a convenient device for applications in the study of biological samples, polymer samples and materials science.
The device can be equipped with digital image registration systems, both manufactured by JEOL (with Hamamatsu matrices) and manufactured by third companies.
Much attention was paid to the simplicity of management and a high degree of automation when performing all operations during the development of this TEM. Therefore, the operator can fully concentrate on the object of research, without being distracted by performing any routine actions.
The newest transmission electron microscope JEM-1400 with high performance and high-contrast electronic optics, having a maximum accelerating voltage of 120 kV and excellent functions for obtaining digitized images and expandable to an analytical configuration, is a convenient device for applications in the study of biological samples, polymer samples and materials science.
JEOL JEM-2100
The JEM-2100 is based on the legendary JEM-2010 TEM, which has long been considered the "de facto" standard in industrial electron microscopy applications and demonstrated the best reliability, image quality and analytical capabilities among all 200 kV high-resolution electron microscopes. The JEM-2100 has an improved control system and better vibration protection. The device is controlled by a computer based on the Windows operating system.
Various prefixes can be installed on the device: EMF and scanning prefixes, various detectors (dark field, secondary and backscattered electrons, etc.), holders with cooling or heating, etc.
The use of a cathode made of lanthanum hexaboride (LaB6) in the device significantly reduces the cost of ownership of this device.
Various prefixes can be installed on the device: EMF and scanning prefixes, various detectors (dark field, secondary and backscattered electrons, etc.), holders with cooling or heating, etc.
The use of a cathode made of lanthanum hexaboride (LaB6) in the device significantly reduces the cost of ownership of this device.
JEOL JEM-2100F
JEM-2100F can rightfully be called a "tool of the XXI century". High stability, excellent technical characteristics, extensibility of functionality, high resolution are the main features of this device. The JEM-2100F device can be equipped with various analytical set-top boxes, a wide range of different holders and set-top boxes.
If necessary, this TEM can be retrofitted with correctors of spherical aberrations of TEM and PREM modes, which allow to achieve sub-extreme resolution, both when obtaining images and when analyzing
If necessary, this TEM can be retrofitted with correctors of spherical aberrations of TEM and PREM modes, which allow to achieve sub-extreme resolution, both when obtaining images and when analyzing
JEOL JEM-2200FS
JEM-2200FS is the optimal solution for research in the field of nanotechnology, including nanobiotechnology, materials science and the semiconductor industry.
The built-in Omega filter allows you to solve analytical problems, and also significantly improves the contrast of images, even when working with thick or frozen samples.
The JEM-2200FS microscope has a built-in precision CCD camera, instead of a traditional fluorescent screen and binocular.
Like all the latest generation TEMS, this microscope has a fully automatic control system.
The built-in Omega filter allows you to solve analytical problems, and also significantly improves the contrast of images, even when working with thick or frozen samples.
The JEM-2200FS microscope has a built-in precision CCD camera, instead of a traditional fluorescent screen and binocular.
Like all the latest generation TEMS, this microscope has a fully automatic control system.
JEOL JEM-ARM200F
JEM-ARM200F is a device announced by JEOL in March 2009. This model is equipped with a standard built-in spherical aberration corrector for the PREM mode. Thanks to the corrector, it was possible to significantly increase the resolution and analytical capabilities of this device, opening up the possibilities of studying samples at the atomic level. The resolution in the raster transmission mode is (STEM-HAADF) 0.08 nm, which is the highest value in the world among serial models of electron microscopes.
The electron probe after correction of all aberrations differs in that it has an order of magnitude higher current density compared to conventional transmission electron microscopes. With fine focusing of such a probe, the JEM-ARM200F microscope allows for analysis at the atomic level with a significant reduction in measurement time and an increase in research productivity.
JEM-ARM200F is the quintessence of all the advanced developments of JEOL in the field of transmission electron microscopy. The guaranteed characteristics of this TEM, as well as its cost, exceed the claimed parameters of any of the transmission electron microscopes currently available on the market.
The electron probe after correction of all aberrations differs in that it has an order of magnitude higher current density compared to conventional transmission electron microscopes. With fine focusing of such a probe, the JEM-ARM200F microscope allows for analysis at the atomic level with a significant reduction in measurement time and an increase in research productivity.
JEM-ARM200F is the quintessence of all the advanced developments of JEOL in the field of transmission electron microscopy. The guaranteed characteristics of this TEM, as well as its cost, exceed the claimed parameters of any of the transmission electron microscopes currently available on the market.
JEOL JEM-3100F
JEM-3100F is a transmission electron microscope with field emission having a resolution of 0.17 nm –the best indicator among all similar devices available on the market. This device is particularly well suited for nanomaterial research.
The perfect digital control system of the device allows the operator to easily use all the features of this PAM.
The accelerating voltage of 300 kV makes it possible to study sufficiently thick samples prepared using focused ion beam cutting systems. JEM-3100F is an unsurpassed tool for solving a wide range of tasks, both research and production: in the field of biology, materials science, for defect analysis and quality control.
The perfect digital control system of the device allows the operator to easily use all the features of this PAM.
The accelerating voltage of 300 kV makes it possible to study sufficiently thick samples prepared using focused ion beam cutting systems. JEM-3100F is an unsurpassed tool for solving a wide range of tasks, both research and production: in the field of biology, materials science, for defect analysis and quality control.
JEM-3200FS
The JEM-3200FS is the world's only 300 kV transmission electron microscope with an energy Omega filter built into the column. Thanks to the Omega filter, this device not only allows you to get high-resolution images, but also becomes an excellent analytical tool that allows you to do elemental analysis at the atomic level.
The new electronic optics eliminates the parasitic rotation of the image, which provides not only the convenience of working in TEM and diffraction modes, but also in the mode of obtaining energy spectra.
In addition to the Omega filter, the device has a number of other unique features, for example, it is a piezo-goniometer that provides sample movements with extreme accuracy.
The new electronic optics eliminates the parasitic rotation of the image, which provides not only the convenience of working in TEM and diffraction modes, but also in the mode of obtaining energy spectra.
In addition to the Omega filter, the device has a number of other unique features, for example, it is a piezo-goniometer that provides sample movements with extreme accuracy.
JSM-IT100
The compact scanning electron microscope was created as a budget model in the company's new generation SEM line
JSM-7610F
Scanning electron microscope with a Schottky thermopole cathode, combining a powerful electron gun and an open-type objective lens
JSM-7800FPRIME
Allows you to get an image with the highest resolution in the world for this class of SEM
JSM-7100F
It is the optimal solution for working with nanoscale samples
JSM-7500F
This device is unique in that even at low accelerating voltage it provides ultra-high resolution
JSM-7600F
The newest model in the JEOL scanning electron microscope line, which implements all the latest advances in JEOL electronic optics technology
JSM-7800F
High Resolution scanning electron Microscope with Schottky Cathode and super Hybrid objective Lens
JSM-6510
Compact multi-purpose RAM with extreme ease of operation and high quality optics.
JEOL scanning electron microscopes with field emission
Scanning electron microscopes with an auto-emission gun (field emission) have a high resolution (up to 0.7 nm)
JIB-4501
Two-beam system, which is a multifunctional scanning electron microscope equipped with a powerful ion cannon
JSM-IT300
New high-performance multifunctional scanning electron microscope
JSM-6010
The initial model in the JEOL line of floor-mounted scanning electron microscopes
JCM-6000 Neoscope II
The latest desktop scanning electron microscope with a tungsten electron source
JSM-IT100
The compact scanning electron microscope JSM-IT100 was created as a budget model in the line of the new generation of SEM by JEOL.
Main advantages:
• A reliable electron-optical column using a special design condenser lens allows you to smoothly change the beam current without changing the focus position;
• Cathodes are pre-centered at the factory; their replacement takes a few minutes;
• Fully automated and well protected from various emergency situations vacuum system ;
• A simple and intuitive user interface for Windows 7 with a well-developed system of tips and video tutorials;
• Smile View program for quick creation of reports;
• The use of an airlock chamber reduces the sample replacement time, reduces contamination of the sample chamber, eliminates the risk of damage to analytical consoles due to sudden pressure drops, prolongs the service life of the cathode and the diaphragm of the objective lens several times;
• The large sample chamber allows you to work with objects up to 150 mm in diameter, as well as to install a variety of installations
Main advantages:
• A reliable electron-optical column using a special design condenser lens allows you to smoothly change the beam current without changing the focus position;
• Cathodes are pre-centered at the factory; their replacement takes a few minutes;
• Fully automated and well protected from various emergency situations vacuum system ;
• A simple and intuitive user interface for Windows 7 with a well-developed system of tips and video tutorials;
• Smile View program for quick creation of reports;
• The use of an airlock chamber reduces the sample replacement time, reduces contamination of the sample chamber, eliminates the risk of damage to analytical consoles due to sudden pressure drops, prolongs the service life of the cathode and the diaphragm of the objective lens several times;
• The large sample chamber allows you to work with objects up to 150 mm in diameter, as well as to install a variety of installations
JSM-7610F
Scanning electron microscope with a Schottky thermopole cathode, combining a powerful electron gun and an open-type objective lens (semi-in-lens). It provides high resolution (0.8 nm at 30 kV in the PREM mode and 1.0 nm at 15 kV in the secondary electron registration mode) Due to this combination, this SEM is equally good for working with dielectrics or electron beam-sensitive samples at low accelerating voltages, and for conducting experiments requiring high beam currents (elemental analysis using a wave dispersion spectrometer, obtaining diffraction patterns of reflected electrons, cathodoluminescent studies, etc.).
JSM-7800FPRIME
The newest SEM with a thermopole cathode JSM-7800F Prime allows you to get the highest resolution image in the world for this class of SEM, thanks to the "Gentle Beam" (GBSH) mode updated compared to the previous model JSM-7800F. In addition, the maximum beam current in a gun with a Schottky cathode of the "In-lens" design has been increased from 200 nA to 500 nA.
JSM-7100F
JSM-7100F is a scanning electron microscope with a Schottky cathode. This microscope is the optimal solution for working with nanoscale samples, it combines the high resolution required to obtain high resolution at high magnifications during visual examination of samples and high current characteristics of the electron beam (beam current up to 200 nA).
JSM-7100F is a scanning electron microscope with a Schottky cathode. This microscope is the optimal solution for working with nanoscale samples, it combines the high resolution required to obtain high resolution at high magnifications during visual examination of samples and high current characteristics of the electron beam (beam current up to 200 nA). Due to the unique design of the electron-optical column, high stability of the beam in time is achieved, which is very important when using methods of energy dispersion analysis, wave dispersion analysis, diffraction of backscattered electrons, cathodoluminescence.
JSM-7100F is a scanning electron microscope with a Schottky cathode. This microscope is the optimal solution for working with nanoscale samples, it combines the high resolution required to obtain high resolution at high magnifications during visual examination of samples and high current characteristics of the electron beam (beam current up to 200 nA). Due to the unique design of the electron-optical column, high stability of the beam in time is achieved, which is very important when using methods of energy dispersion analysis, wave dispersion analysis, diffraction of backscattered electrons, cathodoluminescence.
JSM-7500F
JSM-7500F is an ultra–high resolution auto-emission scanning electron microscope. This device is unique in that even at low accelerating voltage it provides ultra-high resolution (1.4nm at 1 kV). This makes the JSM-7500F an excellent tool for analyzing the texture of nanostructured objects, especially those that are sensitive to the effects of electron beams.
Low sensitivity to floor vibrations and acoustic noise significantly reduces the requirements for preparing the room for the installation of the JSM-7500F. A completely updated interface will allow even novice operators of auto-emission scanning microscopes to feel confident next to this device and get good results.
Low sensitivity to floor vibrations and acoustic noise significantly reduces the requirements for preparing the room for the installation of the JSM-7500F. A completely updated interface will allow even novice operators of auto-emission scanning microscopes to feel confident next to this device and get good results.
JSM-7600F
The JSM-7600F is the newest model in the JEOL scanning electron microscope line, which implements all the latest advances in JEOL electronic optics technology. A thermal field cathode (Schottky), an objective lens with low aberrations and high stability ensure high resolution and a thin probe even at high beam currents (over 200nA at 15kV). It is an ideal solution for the study and analysis of nanostructures.
The multitasking, highly efficient SEM with low power consumption (1.2 kVA) is equipped with a unique combination of an "In-lens" gun, which allows efficiently collecting all electrons and maintaining a high beam current, a heated auto-emission cathode and a lens with an optimal aperture angle for forming a thin probe, even at high currents. The built-in r-filter allows you to mix the signals of secondary and reflected electron detectors, making image analysis even more efficient. The small size of the probe is guaranteed even at low accelerating voltages and high currents. All types of analytical prefixes can be installed on the microscope column, for example, EDS, WDS, EBSD, CL. The small diameter of the probe and optimal conditions allow elemental analysis of samples with the size of the analyzed area of several tens of nanometers.
The multitasking, highly efficient SEM with low power consumption (1.2 kVA) is equipped with a unique combination of an "In-lens" gun, which allows efficiently collecting all electrons and maintaining a high beam current, a heated auto-emission cathode and a lens with an optimal aperture angle for forming a thin probe, even at high currents. The built-in r-filter allows you to mix the signals of secondary and reflected electron detectors, making image analysis even more efficient. The small size of the probe is guaranteed even at low accelerating voltages and high currents. All types of analytical prefixes can be installed on the microscope column, for example, EDS, WDS, EBSD, CL. The small diameter of the probe and optimal conditions allow elemental analysis of samples with the size of the analyzed area of several tens of nanometers.
JSM-7800F
JSM 7800F is a high-resolution scanning electron microscope with a Schottky cathode and a super hybrid objective lens. This microscope implements the latest advances in electronic optics technology, which makes it possible to obtain images with very high resolution on this microscope. The JSM 7800F microscope is a unique research tool for research in various fields of science.
JSM-6510
JEOL JSM-6510 is a compact multi-purpose RAM with extreme ease of operation and high quality optics.
This microscope is designed to meet the needs of both the most demanding researchers and engineers using a scanning electron microscope as a means of control. All the features of the tool are available even to novice users.
Intuitive interface. All operations to control the microscope can be performed using a mouse and an additional remote control. Multi-user system. With the new scanning system, you can work at very small magnifications. The electronic cannon is fully automated. When changing the accelerating voltage, no additional settings are required. Thanks to the unique variable focal length condenser lens developed by JEOL, the focus and position of the field of view are maintained unchanged even at very high magnifications.
This microscope is designed to meet the needs of both the most demanding researchers and engineers using a scanning electron microscope as a means of control. All the features of the tool are available even to novice users.
Intuitive interface. All operations to control the microscope can be performed using a mouse and an additional remote control. Multi-user system. With the new scanning system, you can work at very small magnifications. The electronic cannon is fully automated. When changing the accelerating voltage, no additional settings are required. Thanks to the unique variable focal length condenser lens developed by JEOL, the focus and position of the field of view are maintained unchanged even at very high magnifications.
JEOL scanning electron microscopes with field emission
Scanning electron microscopes with an auto-emission gun (field emission) have a high resolution (up to 0.7 nm). An auto-emission gun uses a cathode in the shape of a tip, at the top of which a strong electric field arises, pulling electrons out of the cathode (auto-electronic emission). The electronic brightness of a gun with an auto-emission cathode is 103-104 times higher than the brightness of a gun with a thermocathode. Accordingly, the current of the electronic probe increases.
JIB-4501
JIB-4501 produced by JEOL (Japan) is a two–beam system, which is a multifunctional scanning electron microscope equipped with a powerful ion cannon. The device can be used simultaneously in the SEM mode, and in the mode of an ion microscope or an ion etching system.
JSM-IT300
EOL JSM-IT300 is a new high-performance multifunctional scanning electron microscope. The device is equipped with a new improved electron-optical system that allows you to obtain high-quality images.
There are many ports provided on the body of the microscope, which allows you to simultaneously install various additional analysis systems, such as: an energy dispersion analysis system, a wave dispersion analysis system and a backscattered electron diffraction system or several energy dispersion analysis detectors, which turns the microscope into a universal analytical complex. It is also possible to install a cathodoluminescence system, X-ray tomography, various indentation systems, etc.
There are many ports provided on the body of the microscope, which allows you to simultaneously install various additional analysis systems, such as: an energy dispersion analysis system, a wave dispersion analysis system and a backscattered electron diffraction system or several energy dispersion analysis detectors, which turns the microscope into a universal analytical complex. It is also possible to install a cathodoluminescence system, X-ray tomography, various indentation systems, etc.
JSM-6010
This is the initial model in the JEOL line of floor-mounted scanning electron microscopes. The JEOL JSM 6010 microscope is equipped with an electron-optical system similar to older models, which allows you to get high-resolution images on it. A distinctive feature of this model is its mobility, i.e. no water connection is required for its operation, and all vacuum pumps are located directly on the main unit, so the microscope can be moved around the room, the main thing is that there would be a source of electricity nearby.
The device is equipped with secondary and back-reflected electron detectors, and also allows you to work in low vacuum conditions. This makes it possible to solve a wide range of tasks in the field of materials science, biology, medicine, geology, etc. with the help of this microscope.
The device is equipped with secondary and back-reflected electron detectors, and also allows you to work in low vacuum conditions. This makes it possible to solve a wide range of tasks in the field of materials science, biology, medicine, geology, etc. with the help of this microscope.
JCM-6000 Neoscope II
The JCM-6000 Neoscope II is the LATEST desktop scanning electron microscope with a tungsten electron source. Having a cost comparable to the cost of good light microscopes, it has a much greater depth of focus and incomparably better resolution. As a consequence, the JCM-6000 can operate in the magnification range from x10 to x60000 times. The software allows for high-precision quantitative measurements on images. The small size, the possibility of easy movement on wheels and the need for only one standard electrical outlet for connection, make it possible to use the JCM-6000 as a demonstration device, or as a transported device as part of a mobile laboratory. User-friendly software, ease of management, low cost and low operating costs make this device very attractive for use in scientific and educational purposes, as well as for conducting in-line serial research in production.
JIB-4610F Multi Beam
A Schottky cathode with field emission and a Gallium ion gun combined in one system
JIB-4501 MultiBeam SEM-FIB
Beam current: up to 60 nA (30 kV)
Gallium Ion Gun
Gallium Ion Gun
JIB-4000 Focused Ion Beam Milling & Imaging System
Allows you to get an image with the highest resolution in the world for this class of SEM
JIB-4500
It is the optimal solution for working with nanoscale samples
JIB-4600F
This device is unique in that even at low accelerating voltage it provides ultra-high resolution
JEM-9320FIB
A Schottky cathode with field emission and a Gallium ion gun combined in one system
JIB-4610F Multi Beam
Object Holder Parameters:
- Diameter up to 150 mm height up to 6 inches
- X: 50mm Y: 50mm
- Z: 1.5mm to 41mm
- Slope: -5° to 70°
- Rotation: 360°
- Ultra-cone objective lens Aperture angle optimizing lens (lenses optimized for opening angle)
- Lower electron detector (low-energy electron detector)
- -detectorR-BEI (Option)
- -STEM detector (option)
- Gentle Beam (specific bias voltage 0 to -2,000V) GIS (C, W, Pt), EDS, WDS, EBSD, CL, Cryo, Chamber camera, Stage navigation system (SNS)
- SEM: 1.2nm (30kV), 3.0nm (1kV)
- FIB: 4 nm (30kV)
JIB-4501 MultiBeam SEM-FIB
- Beam current: up to 60 nA (30 kV)
- Gallium Ion Gun
- Etched area:
- rectangle line or dot
- Object Holder Parameters:
- Diameter 28 mm height 13 mm
- Diameter 50 mm height 2 mm
- X: ± 11mm Y: ± 15mm
- Z: 0.5mm to -23mm
- Slope: -5° to 60°
- Rotation: 360°
- RESOLUTION: 5 nm (at 30 kV)
- Magnification: x60 (overview)
- from x200 to x300,000
- Accelerating voltage: From 1 to 30 kV (in increments of 5 kV)
JIB-4000 Focused Ion Beam Milling & Imaging System
- Gallium Ion Cannon
- Beam current up to 60 nA (30 kV)
- Etched area:
- rectangle line or dot
- Provides application (coating) on the surface of a sample of carbon, tungsten, platinum
- Object Holder Parameters:
- Diameter 28 mm height 13 mm
- Diameter 50 mm height 2 mm
- X: ± 11mm Y: ± 15mm
- Z: 0.5mm to -23mm
- Slope: -5° to 60°
- Rotation: 360°
- RESOLUTION: 5 nm (at 30 kV)
- Magnification: from x200 to x300,000 x60 (overview)
- Accelerating voltage: From 1 ... 30 kV (in increments of 5 kV)
JIB-4500
JEOL JIB-4500 Multibeam is a low-cost two-beam (ion-electronic) system with an auto-emission LaB6 electron source and an ion gun for micro etching manufactured by JEOL (Japan)
JEOL Ltd. is a world leader in the production and development of scanning (scanning) electron microscopes (SEM), transmission electron microscopes (TEM), surface analyzers (AUGER microanalysts, photoelectron spectrometers, electron probe microanalysts EPMA), focused ion beam systems, mass spectrometers, nuclear magnetic resonance (NMR) spectrometers and electron beam lithography systems for the production of semiconductor devices.
JEOL JIB-4500 MultiBeam is an inexpensive to maintain high–performance scanning electron microscope (SEM) with a cathode of lanthanum hexaboride + a high-performance prefix with a focused ion beam.
The device is equipped with highly sensitive detectors that can work simultaneously in real time.
JEOL Ltd. is a world leader in the production and development of scanning (scanning) electron microscopes (SEM), transmission electron microscopes (TEM), surface analyzers (AUGER microanalysts, photoelectron spectrometers, electron probe microanalysts EPMA), focused ion beam systems, mass spectrometers, nuclear magnetic resonance (NMR) spectrometers and electron beam lithography systems for the production of semiconductor devices.
JEOL JIB-4500 MultiBeam is an inexpensive to maintain high–performance scanning electron microscope (SEM) with a cathode of lanthanum hexaboride + a high-performance prefix with a focused ion beam.
The device is equipped with highly sensitive detectors that can work simultaneously in real time.
JIB-4600F
JIB-4600F MultiBeam is a hybrid system combining a high—resolution SEM and a system with a focused ion beam for micro etching (layer-by-layer etching of samples).
SEM allows positioning the ion beam at the etching site with high accuracy and visualizing the etching process with a resolution of up to 1.2 nm.
Due to the high current of the probe (up to 200 nA), the device allows you to effectively use microanalysis consoles (EMF, DORE), and a large number of ports open up wide possibilities for retrofitting the device with various consoles.
Also, it is possible to install Omniprobe series nanomanipulators directly into the sample chamber of this device, which allow for various mechanical manipulations with modified objects.
SEM allows positioning the ion beam at the etching site with high accuracy and visualizing the etching process with a resolution of up to 1.2 nm.
Due to the high current of the probe (up to 200 nA), the device allows you to effectively use microanalysis consoles (EMF, DORE), and a large number of ports open up wide possibilities for retrofitting the device with various consoles.
Also, it is possible to install Omniprobe series nanomanipulators directly into the sample chamber of this device, which allow for various mechanical manipulations with modified objects.
JEM-9320FIB
The JEM-9320FIB focused ion beam system is designed to modify samples with a finely focused beam of galium ions. A gun with a source of liquid galium provides currents of up to 30 nA with a small diameter of the probe.
The ion beam is focused using an electrostatic lens system and scans the surface of the sample, which, in turn, emits secondary electrons, the detection of which results in images of scanning ion microscopy (SIM).
At high beam currents, JEM-9320FIB performs high-speed point modification of the sample by ion etching. The etched area can be a rectangle, a line, or a point.
The device can produce thin samples (from a wide class of materials) for transmission and scanning electron microscopes. It also makes it possible to obtain cross-sections of SEM samples.
The ion beam is focused using an electrostatic lens system and scans the surface of the sample, which, in turn, emits secondary electrons, the detection of which results in images of scanning ion microscopy (SIM).
At high beam currents, JEM-9320FIB performs high-speed point modification of the sample by ion etching. The etched area can be a rectangle, a line, or a point.
The device can produce thin samples (from a wide class of materials) for transmission and scanning electron microscopes. It also makes it possible to obtain cross-sections of SEM samples.
Request for equipment
You can order the equipment you are interested in using the form below. Specialists of Silk Way XXI century LLC will contact you in the near future to clarify your order and advise on all questions of interest.
